[7a-PB1-1~8] 9.3 Nanoelectronics

[7a-PB1-2] Electrical Properties of Series-Parallel-Connected Au Nanogaps During Electromigration-Based Current Biasing Method

〇Koji Minami¹, Soki Tani¹, Mamiko Yagi¹, Mitsuki Ito¹, Jun-ichi Shirakashi¹ (1.Tokyo Univ. Agr. & Tech.)

Keywords:Nanogap, Electromigration, Series-Parallel Circuits