19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

講演情報

Th-2: SiC-2

SiC

Th-2: SiC-2

2022年9月1日(木) 16:45 〜 18:15 DRIP ONLINE CONFERENCE

Chair:Michael Dudley、Yukari Ishikawa

17:30 〜 17:45

[Th2-3] Strain Evolution in N and Al Ion Implantation Doping in 4H-SiC Epilayers

*Xuan Zhang1, Jiaxu Gao2, Liguo Zhang1, Xiang Kan1, Tao Ju1, Baoshun Zhang1, Dan Fang2 (1. Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, 2. Changchun University of Science and Technology)