Evaluation of ultra-wide field of view by keeping high spatial resolution Talbot-type X-ray microscopy

Y. Wu

15:30 〜 17:30

[P10-06] Evaluation of ultra-wide field of view by keeping high spatial resolution Talbot-type X-ray microscopy

^○Y. Wu ^1,2, H. Takano ^1,2, M. Hoshino ^2,3, K. Vegso ^2,3, H. Han ^1,4, K. Matsuo ⁵, A. Momose ^1,2,3 (1.Tohoku Univ. (Japan), 2.JST-ERATO (Japan), 3.JASRI (Japan), 4.Univ. of Sci. and Tech.of China (China), 5.Keio Univ. (Japan))

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講演情報

[P10] 10: X-ray and High-energy Optics

[P10-06] Evaluation of ultra-wide field of view by keeping high spatial resolution Talbot-type X-ray microscopy

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