The 24th Congress of the International Commission for Optics

講演情報

Poster Session

03: Optical Metrology

[P3] 03: Optical Metrology

2017年8月22日(火) 15:30 〜 17:30 Room P (HANA) (4F)

15:30 〜 17:30

[P3-03] Mode-resolved amplitude and phase imaging by dual-comb spectroscopy combined with a single-pixel imaging

K. Shibuya 1,2, T. Minamikawa 1,2, Y. Mizutani 2,3, T. Yasui 1,2, T. Iwata 1,2 (1.Tokushima Univ. (Japan), 2.JST, ERATO MINOSHIMA Intelligent Optical Synthesizer Project (Japan), 3.Osaka Univ. (Japan))

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