Improving the spatial resolution of passive near-field microscope with a 10 nm-sharp tungsten probe apex

[D-1-7] Improving the spatial resolution of passive near-field microscope with a 10 nm-sharp tungsten probe apex

〇Hitomi Nakajima¹, Lin Kuan-Ting¹, Ryoko Sakuma¹, Fuminobu Kimura¹, Yusuke Kajihara¹ (1.The University of Tokyo)

Keywords:Measurement、Passive near-field microscopy、Electrochemical etching、Spatial resolution、Tungsten probe