[Mo-P] Poster Presentation

[Mo-P-14] Run-up Width for Photo-induced Expansion of Single Shockley Stacking Faults in 4H-SiC

*Koji Maeda¹, Koichi Murata¹, Takeshi Tawara^2,3, Isao Kamata¹, Hidekazu Tsuchida¹ (1. Central Res. Inst. of Electric Power Industry(CRIEPI)(Japan), 2. National Inst. of Advanced Sci. and Tech.(AIST)(Japan), 3. Fuj Electric Co. Ltd.(Japan))