スケジュール 3 13:45 〜 15:45 [Th-P-55LN] Parameter Spread and its Effect on Lifetime in Discrete SiC MOSFETs *Thomas Ziemann1, Joni Jormanainen2, Elena Mengotti3, Ulrike Grossner1 (1. Advanced Power Semiconductor Laboratory, ETH Zurich(Switzerland), 2. ABB Oy(Finland), 3. ABB Schweiz AG(Switzerland))