スケジュール 0 16:15 〜 18:15 [Tu-P-30] Investigation on Electrical Characteristics of 4H-SiC Schottky-Barrier-Diodes after Silicon-Cap-Annealing *Daichi Todo1, Hiroaki Hanafusa1, Seiichiro Higashi1 (1. Hiroshima Univ.(Japan))