[Tu-P] Poster Presentation

[Tu-P-45] Evaluation of SiC-MOSFET by Repetitive UIS Tests for Solid State Circuit Breaker

*Mitsuhiko Sagara¹, Keiji Wada¹, Shin-ichi Nishizawa² (1. Tokyo Metropolitan Univ.(Japan), 2. Kyushu Univ.(Japan))