[TuP] Poster

[TuP-36] Influence of External Cavity Configuration on the Failure Mode of High Power Wavelength Stabilized Laser Diode

*Rintaro Morohashi¹, Yohei Kasai¹, Masahiro Uchiyama¹, Toshiyuki Kawakami², Yuji Yamagata¹ (1. Fujikura Ltd. (Japan), 2. Optoenergy Inc. (Japan))

Presentation style: On-site (in-person)

キーワード：semiconductor laser diode, wavelength stabilization, failure mode