[Mon-J1] Joint session of Low-dimensional Quantum Materials and Nanometer Structures

[Mon-J1-4] Comparative study on carrier distribution of mechanically exfoliated WSe₂/SiO₂ and suspended WSe₂ by scanning nonlinear dielectric microscopy

Koki Takano¹, *Kohei Yamasue¹, Toshiaki Kato¹, Toshiro Kaneko¹, Yasuo Cho¹ (1. Tohoku University (Japan))

キーワード：Scanning nonlinear dielectric microscopy, Local deep level transient spectroscopy, 2D materials, Tungsten diselenide