日本地球惑星科学連合2014年大会

講演情報

インターナショナルセッション(口頭発表)

セッション記号 P (宇宙惑星科学) » P-CG 宇宙惑星科学複合領域・一般

[P-CG11_28AM1] Instrumentation for space science

2014年4月28日(月) 10:00 〜 10:45 421 (4F)

コンビーナ:*松岡 彩子(宇宙航空研究開発機構 宇宙科学研究所 太陽系科学研究系)、吉川 一朗(東京大学)、座長:松岡 彩子(宇宙航空研究開発機構 宇宙科学研究所 太陽系科学研究系)、吉川 一朗(東京大学)

10:30 〜 10:45

[PCG11-P01_PG] Effects of finite electrode area ratio on Langmuir probe measurement

ポスター講演3分口頭発表枠

*CHEN Wen-hao1JIANG Guo-hsiang1HSU Yu-wei1FANG Hui-kuan2OYAMA Koichiro3CHENG Chio3 (1.Institute of Space and Plasma Sciences, National Cheng Kung University、2.Department of Physics, National Cheng Kung University、3.Plasma and Space Science Center, National Cheng Kung University)

キーワード:Langmuir probe, finite electrode area ratio, electrode surface contamination, pico/nano-satellite, electron temperature, electron density

Langmuir probe(LP) is a widely used instrument for measuring electron density and temperature on satellites and rockets. Recently pico- and nano- satellites have become more popular, when the surface area of satellite is similar to the probe, the effects on LP measurement due to limited satellite surface area need to be considered, and these effects may cause LP measurement inaccurate. We have investigated the effect of satellite surface area, satellite and probe contamination and LP sweeping frequency in laboratory. Also we have found that the satellite and probe voltage will decrease when a large quantity of electrons are attracted by probe voltage and the contamination effect of satellite surface becomes major.
In summary, a solution to these problems is suggested.