Japan Geoscience Union Meeting 2022

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[J] Oral

S (Solid Earth Sciences ) » S-IT Science of the Earth's Interior & Techtonophysics

[S-IT22] Innovation through the Integration of Solid Earth Science and Materials Science

Mon. May 23, 2022 1:45 PM - 3:15 PM 102 (International Conference Hall, Makuhari Messe)

convener:Kenji Kawai(Department of Earth and Planetary Science, School of Science, University of Tokyo), convener:Jun Tsuchiya(Geodynamics Research Center, Ehime University), Satoshi Ohmura(Hiroshima Institute of Technology), convener:Noriyoshi Tsujino(Institute for Planetary Materials, Okayama University), Chairperson:Kenji Kawai(Department of Earth and Planetary Science, School of Science, University of Tokyo), Jun Tsuchiya(Geodynamics Research Center, Ehime University), Satoshi Ohmura(Hiroshima Institute of Technology), Noriyoshi Tsujino(Institute for Planetary Materials, Okayama University)

1:45 PM - 2:00 PM

[SIT22-01] Time-resolved transmission electron microscopy in material science

★Invited Papers

*Makoto Kuwahara1 (1.Nagoya University)

Keywords:transmission electron microscopy, time resolved

Time-resolved measurement in a transmission electron microscopy (TEM) holds promises of reveling intrinsic feature in nano-materials. Our group had developed time-resolved TEM (TR-TEM) using photocathode-type electron gun which could synchronize with time-structure of pulsed laser. The TR-TEM can provide a narrow energy width of below 0.3 eV and 1-ps pulse duration of electron beam. Furthermore, it has been clarified that the pulsed electron could contribute to observe time evolutions of electromagnetic field. High charge electron pulse in TRTEM also has possibility to realize operando-measurement of rock friction via nanosecond single-shot imaging, which can investigate rock friction at high sliding velocity and effect of ambient temperature, pressure, and pore pressure on friction. The technique will open to access nanometer-scale mechanics of faulting origin in geoscience. We would like to introduce overview of our apparatus and recent status of ultrafast measurement in electron microscopy.