JpGU-AGU Joint Meeting 2017

講演情報

[JJ] ポスター発表

セッション記号 S (固体地球科学) » S-VC 火山学

[S-VC47] [JJ] 活動的火山

2017年5月22日(月) 15:30 〜 17:00 ポスター会場 (国際展示場 7ホール)

コンビーナ:前田 裕太(名古屋大学)、青木 陽介(東京大学地震研究所)

[SVC47-P23] 霧島硫黄山周辺の1次元比抵抗構造と震源再決定

*塚本 果織1相澤 広記2神田 径3上嶋 誠4関 香織5木下 貴裕5宇津木 充6小山 崇夫4 (1.九州大学大学院理学府地球惑星科学専攻、2.九州大学大学院理学研究院所属・地震火山観測研究センター、3.東京工業大学理学院火山流体研究センター、4.東京大学地震研究所、5.東京工業大学理学院地球惑星科学系、6.京都大学大学院理学研究科付属地球熱学研究施設火山研究センター)

Iwo-yama is the youngest volcano in the Kirishima volcanic group. Around Iwo-yama and Karakuni-dake, shallow (depth < 2km) tectonic earthquakes have increased since December 2013, and volcanic tremors have occasionally occurred since July 2015 (Japan Meteorological Agency, volcanic activity commentary document). Furthermore, the fumarolic gases appeared in December 2015 for the first time in 12 years. The leveling survey detected the ground uplift during June to December 2015, and its pressure source was estimated at a depth of 700 m, 150 m east of the crater (Matsushima et al.,2015). Therefore, it is reasonable to be concerned about the occurrence of hydrothermal eruptions.
In order to investigate the mechanism of these volcanic activities and possibility of future eruptions, we conducted broadband (0.005 to 3000s) magnetotelluric (MT) measurements around the Iwo-yama in April 2016. We recorded two components of electric fields at 20 observation sites and five components of electric and magnetic fields at 7 observation sites. One-dimensional inversion revealed that the shallow earthquakes occur beneath a shallow electric conductive layer, which is interpreted as a hydrothermal altered clay dominant zone. The pressure source by the leveling survey corresponds to the bottom of the conductive layer. These spatial relationships suggest that the supply of high temperature fluids has increased beneath Iwo-yama, and causes the increase in pore pressure beneath clay layer, resulting in the increase of earthquakes and ground inflation. In this presentation, we will further estimate the precise depth of earthquakes, and will investigate its relation to the shallow conductive layer.