The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

07. Beam Technology and Nanofabrication » 7.2 Electron microscopes, evaluation, measurement and analysis

[19a-A14-1~10] 7.2 Electron microscopes, evaluation, measurement and analysis

Fri. Sep 19, 2014 9:00 AM - 11:45 AM A14 (E305)

11:00 AM - 11:15 AM

[19a-A14-8] Aberration-corrected Environmental TEM Observation of the Surface Structure of Pt Nanoparticles

Hideto Yoshida1, Hiroki Omote1,2, Seiji Takeda1 (ISIR, Osaka Univ.1, Graduate School of Engineering, Osaka Univ.2)

Keywords:白金,ナノ粒子,環境TEM