The 61st JSAP Spring Meeting, 2014

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15. Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[19a-PG5-1~8] 15.8 Crystal evaluation, impurities and crystal defects

Wed. Mar 19, 2014 9:30 AM - 11:30 AM PG5 (G棟2階)

9:30 AM - 11:30 AM

△ [19a-PG5-5] Evaluation of GaN wafer for power devices by Raman spectroscopy

○Shogo Ando1, Shota Suzuki1, Hidekazu Yamamoto1 (Chiba Inst. of Tech.1)

Keywords:GaN,ラマン散乱分光法