[14p-2C-1~12] 4.3 Optical Micro-sensing, Manipulation, and Fabrications

▲ [14p-2C-9] [JSAP-OSA Joint Symposia 2015 Invited Talk] Near-field multi-probe diagnosis of subwavelength-scale optoelectronics functionalities

〇Hirokazu Hori¹, Kazuharu Uchiyama¹, Masaru Sakai¹, Hitoshi Nejo¹, Kiyoshi Kobayashi¹ (1.Univ. Yamanashi)

キーワード：near-field optics,probe microscopy,functional deveices

For multi-aspect diagnosis of optoelectronics functionalities of subwavelength scales, we have developed several different types of multi-probe diagnosing apparatus, such as an STM-controlled scanning near-field optical microscope, STM-SNOM, with counter two probes enabling an observation of front-to-back transport of local optoelectronic excitation through a functional multilayered quantum structure operating at low temperature under applied magnetic field up to 9T, a three-probe SNOM system which enables us with tracing paths of excitation transfer, and a hole-array system revealing concurrent correlations between local events. We present the details of each apparatus and applications based operation mechanism and expected functionality diagnosis of hierarchical features of optoelectronics interactions in nanometer scales.