[15p-1E-1~10] 3.8 光計測技術・機器

▲ [15p-1E-9] Z-scan measurement of sputter growth Tantalum pentoxide

Chung-Lun Wu¹, Wun-Long Yan¹, Yi-Jen Chiu¹, Yuan-Yao Lin¹, Ann-Kuo Chu¹, 〇Chao-Kuei Lee¹ (1.Department of Photonics, National Sun Yat-sen University)

キーワード：Ta2O5,Z-scan measurement

To optimize the performance, such as frequency conversion, material or devices modulation and so on, nonlinear nature of material has been applied accompanying with the development of laser. As a result, the optical nonlinearity, for example: nonlinear refractivity, saturation flurence, are very important.In this work, using femtosecond Z-scan technique, the nonlinearities of sputter growth Tantalum pentoxide (Ta₂O₅) were investigated. The nonlinear refractive around 10^-12 (cm²W^-1) at 800nm was extracted from Z-scan profile. The clear wavelength dependence of n2 was investigated as well. Compared to conventional materials for nonlinear waveguide, Ta₂O₅ exhibits the feasibility for nonlinear devices. Furthermore, the nature of low loss shows the potential for the ultrabroad band frequency comb and optical computing.