2016年 第77回応用物理学会秋季学術講演会

講演情報

一般セッション(口頭講演)

7 ビーム応用 » 7.5 イオンビーム一般

[14p-B6-1~12] 7.5 イオンビーム一般

2016年9月14日(水) 13:45 〜 17:15 B6 (展示控室2)

後藤 康仁(京大)、二宮 啓(山梨大)

16:00 〜 16:15

[14p-B6-8] タングステン針を用いたグリシンのアトムプローブ分析

羽路 祐紀1、入場 紀明1、西村 知紗1、曽根 輔1、辻 博司1、後藤 康仁1 (1.京大院工)

キーワード:アトムプローブ分析、飛行時間形質量分析、グリシン

We have previously shown a newly developed time-of-flight mass spectrometer with a capability of identification of lighter atom ions. In this study, time-of-flight measurement with the spectrometer was performed in ion beam extracted from glycine. The simplest structural amino acid, glycine, was formed on a sharp tungsten tip by vacuum deposition. The obtained mass spectra exhibit the dependence of produced ion species depending on field strength. In a condition of limited evaporation yields by dc voltage application to the specimen, singly charged monomer were measured. Given higher tip voltage, doubly charged monomer and a specific fragment pair upon C-C bond dissociation were predominantly detected. Our results suggest that tip voltage level control determines the produced ion species during atom probe analysis, preventing overlaps in mass spectrum and providing possibility of further accurate identification of ions.