[19p-H137-1~17] 7.1 X-ray technologies

▲ [19p-H137-7] X-ray phase scanner using Talbot-Lau interferometry for non-destructive testing – II

〇(P)Shivaji Bachche¹, Masahiro Nonoguchi², Koichi Kato², Masashi Kageyama², Takafumi Koike², Masaru Kuribayashi², Atsushi Momose¹ (1.Tohoku University, 2.Rigaku)

Keywords:x-ray phase imaging,phase scanner,non-destructive testing

The X-ray Talbot and Talbot-Lau interferometers which are composed of transmission gratings and measure the differential X-ray phase shifts have gained popularity because they operate with polychromatic beams. A non-destructive testing in industrial field using these interferometers for continuous sample scanning is not yet completely revealed. A scanning setup is very often favorable when compared to a direct 2D image acquisition in terms of field of view, exposure time, illuminating radiation, etc. This research work demonstrates the feasibility of an X-ray phase sensitive scanner using laboratory X-ray source and Talbot-Lau interferometer for non-destructive testing.
The performance of phase scanner with Talbot-Lau interferometer configuration was tested using laboratory X-ray source by scanning a long moving sample (highlighter pen) at a speed of 5 mm/s and absorption, differential-phase and visibility images were generated by processing non-uniform moiré movie with our specially developed phase-measurement algorithm. The results implies successful feasibility of X-ray phase imaging using scanning setup for non-destructive testing in combination with a conveyer system.