[19p-S621-1~9] 偏光計測制御の新展開

▲ [19p-S621-9] A partial Mueller matrix polarimeter using two photoelastic modulator and polarizer pairs

〇(B)Tipol Nia Natasha¹、Kawabata Shuichi²、Otani Yukitoshi¹ (1.Utsunomiya Univ. for Utsunomiya University、2.Tokyo Polytechnic Univ. for Tokyo Polytechnic University)

キーワード：mueller matrix,photoelastic modulator

The theoretical approach is presented for measuring the partial Mueller matrix of a sample by using two photoelastic modulator-polarizer pairs, where the photoelastic modulators are operating at different resonant frequencies. The two PEMs in the instrument are oriented 45° apart. From the given configuration, partial Mueller matrix in terms of the output light intensity of the light beam can be defined.