The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

8 Plasma Electronics » 8.4 Plasma etching

[19p-W621-1~12] 8.4 Plasma etching

Sat. Mar 19, 2016 2:30 PM - 5:45 PM W621 (W6)

Hisataka Hayashi(TOSHIBA), Koji Eriguchi(Kyoto Univ.)

4:15 PM - 4:30 PM

[19p-W621-7] Feasibility study of monitoring of inner walls of plasma etching chamber using load impedance monitoring system

Yuji Kasashima1, Fumihiko Uesugi1 (1.AIST)

Keywords:plasma impedance,particle,deposited film