6:15 PM - 6:30 PM
△ [20p-S622-17] Far-ultraviolet surface plasmon resonance properties of aluminum depending on the surrounding refractive index
Keywords:surface plasmon resonance sensor,far ultraviolet,aluminum
Recently, we are developing a novel far- and deep-ultraviolet SPR sensor using aluminum (Al) thin film. As contrast to conventional visible SPR sensors based on gold (Al) and silver (Ag) thin film, the Al-based SPR sensor can be used in far-ultraviolet (FUV, ≤200 nm) and deep-ultraviolet (DUV, ≤300 nm) regions. The FUV-DUV SPR sensor may have three significant advantages.
(1) Many materials have strong absorptions (i.e. large changes of the dielectric constant) in the FUV and DUV region even if these materials have no absorption in the visible region. Therefore, The FUV-DUV SPR sensor may have higher sensitivity than the visible SPR sensors.
(2) By using shorter wavelength (FUV and DUV) light than visible light, the measurement field (i.e. the evanescent wave range) is narrowly limited compared with the visible SPR sensors. Therefore, the FUV-DUV SPR sensor can achieve the surface-selective detection.
(3) Each material shows a unique spectral shape, even if these materials have no absorption in the visible region. Therefore, by using the FUV and DUV region, a material-selectivity can be achieved.
Because of these advantages, the FUV-DUV SPR sensor can be expected as a new refractive index sensor with high-sensitivity and material-selectively. In particular, the material-selectivity is a novel characteristic, which is not achieved by the visible SPR sensors.
In the present presentation, we show Al-SPR property changes due to the presence of 1,1,1,3,3,3-hexafuloro-2-propanol (HFIP) on the Al film.
(1) Many materials have strong absorptions (i.e. large changes of the dielectric constant) in the FUV and DUV region even if these materials have no absorption in the visible region. Therefore, The FUV-DUV SPR sensor may have higher sensitivity than the visible SPR sensors.
(2) By using shorter wavelength (FUV and DUV) light than visible light, the measurement field (i.e. the evanescent wave range) is narrowly limited compared with the visible SPR sensors. Therefore, the FUV-DUV SPR sensor can achieve the surface-selective detection.
(3) Each material shows a unique spectral shape, even if these materials have no absorption in the visible region. Therefore, by using the FUV and DUV region, a material-selectivity can be achieved.
Because of these advantages, the FUV-DUV SPR sensor can be expected as a new refractive index sensor with high-sensitivity and material-selectively. In particular, the material-selectivity is a novel characteristic, which is not achieved by the visible SPR sensors.
In the present presentation, we show Al-SPR property changes due to the presence of 1,1,1,3,3,3-hexafuloro-2-propanol (HFIP) on the Al film.