The 63rd JSAP Spring Meeting, 2016

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Symposium » State-of-the-art characterization technique of dielectric and ferroelectric materials

[20p-W641-1~9] State-of-the-art characterization technique of dielectric and ferroelectric materials

Sun. Mar 20, 2016 1:45 PM - 6:15 PM W641 (W6)

Wataru Sakamoto(Nagoya Univ.), Satoshi Wada(Univ. of Yamanashi)

2:45 PM - 3:15 PM

[20p-W641-3] Application of Raman Scattering Spectroscopy to Evaluation of Dielectric Properties

〇Hiroki Taniguchi1 (1.Nagoya Univ.)

Keywords:Raman scattering,spectral analysis

Raman scattering spectroscopy enables on-demand detection of various physical, chemical, and mechanical properties and visualization of their spatial variation by a combination of state-of-art apparatuses and appropriate spectral analyses. I will discuss in my talk how to analyze Raman spectra from viewpoints of lattice dynamics and symmetry of materials.