2017年第78回応用物理学会秋季学術講演会

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22 合同セッションM 「フォノンエンジニアリング」 » 22.1 合同セッションM 「フォノンエンジニアリング」

[7a-C22-1~12] 22.1 合同セッションM 「フォノンエンジニアリング」

2017年9月7日(木) 09:00 〜 12:45 C22 (C22)

中村 芳明(阪大)、塩見 淳一郎(東大)

10:00 〜 10:15

[7a-C22-5] Enhancement of Thermoelectric Performance of Si Film by Al Ultrathin Layer Deposition

〇(M2C)Anthony Fracasso George1、Ryoto Yanagisawa1、Masahiro Nomura1,2,3 (1.University of Tokyo, IIS、2.Nanoquine、3.JST PRESTO)

キーワード:silicon thermoelectrics, ultra-thinfilm, energy harvesting

With increasing public interest in alternative energy sources, research and development groups are seeking thermoelectric (TE) applications with a low environmental load. Since the TE efficiency of bulk Si is quite low, nanoscale modifications are required to increase ZT and thus its potential use in commercial TE devices. However, many modifications rely on expensive lithography techniques which cannot yield an affordable commercialized TE device. This work demonstrates a low-cost method for increasing the ZT value of doped Si membranes over a large area by the deposition of Al thin films on the Si surface. Suspended bridge structures and isolated Si regions were fabricated in an n-doped SOI wafer for thermal conductivity and electrical conductivity measurements respectively. After fabrication, electron-beam evaporation was used to apply ultra-thinfilms onto the entire silicon surface of two sample sets. A third sample set, with no Al, was left as a reference structure. Within the range of typical operating temperature, thermal conductivity measurements were taken by using the micro-time domain thermalreflectance setup and electrical conductivity was measured using a four-probe technique. Al depositied samples show a ~25% decrease in thermal conductivity and with a minimal reduction in electrical conductivity compared to plain doped membranes. This yields a ~33% increase in the σ / κ ratio in both 0.5 nm and 1.0 nm Al deposited membranes at all measured temperatures.