The 64th JSAP Spring Meeting, 2017

Presentation information

Symposium (Oral)

Symposium » Progress and outlook of nanoimprint technology

[15p-512-1~9] Progress and outlook of nanoimprint technology

Wed. Mar 15, 2017 1:30 PM - 6:00 PM 512 (512)

Atsushi Yokoo(NTT), Hiroshi Hiroshima(AIST)

3:30 PM - 4:15 PM

[15p-512-4] Nano imprint lithography appling for semiconductor devices

Tatsuhiko Higashiki1,2 (1.TOSHIBA, 2.NuFlare)

Keywords:semiconductor, nano imprint, lithography

We have been studying nano imprint lithography called NIL that print device patterns on the template to silicon wafer directory. NIL had some subjects such as overlay accuracy and defect control. In this paper, I will talk about NIL technology updates and applying to semiconductor devices in production line.