2017年第64回応用物理学会春季学術講演会

講演情報

一般セッション(口頭講演)

3 光・フォトニクス » 3.8 光計測技術・機器

[17a-418-1~10] 3.8 光計測技術・機器

2017年3月17日(金) 09:00 〜 11:45 418 (418)

森田 隆二(北大)、渡邉 紳一(慶大)

11:00 〜 11:15

[17a-418-8] Precise profilometry for scattered media and tomography for multiple-layers samples using the Discrete frequency scanning laser

〇(D)Truong Tuan Cong1、Banh Tuan Quoc1,2、Shioda Tatsutoshi1 (1.Saitama University、2.Sevensix Inc.)

キーワード:discrete frequency scanning laser, tomography

We propose the novel discrete frequency scanning laser of 200 GHz scanning step for industrial profilometry and tomography. The laser ring cavity of the proposed light source consists of a lasing medium, a frequency tuning part, and the Fabry-Perot etalon as a frequency comb generator. The proposed light source is used in the precise profilometry and tomography for the scattered media and multiple-layers samples, respectively.