The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[21p-223-1~12] 7.2 Applications and technologies of electron beams

Fri. Sep 21, 2018 1:15 PM - 4:30 PM 223 (223)

Yoichiro Neo(Shizuoka Univ.), Mitsunori Kitta(AIST)

4:15 PM - 4:30 PM

[21p-223-12] Focusing an Electron-Beam Array with a Multi-hole Permanent Magnet

Kazuki Hiraoka1, Katsuhide Tsuno2, Taeko Ando3, Kazuhiro Shimonomura3, Etoh Takeharu3 (1.Advanced Science Laboratory, Inc., 2.EOS Tsuno, 3.Ritsumeikan Univ.)

Keywords:Electron beam array, Permanent magnet, High-speed imaging

A simulation study confirmed technical feasibility of a magnetic lens with a multi-hole permanent magnet to focus an electron beam array. Contrary to prior anticipation, the magnet field intensity is substantially flat in the central area of the multi-hole permanent magnet with the diameter of 6 mm. Only a slight non-uniformity is observed in the radius direction in the area. Though the outer edge of the magnet strongly distorts the intensity distribution on the peripheral area, the area of the influence is only 1 mm wide. The beam convergence rate in the uniform area is around 1/10 for a simple basic model, and 1/40 for an improved model.An application of the technology is proposed to ultra-high-speed imaging with the temporal resolution of picoseconds.