The 80th JSAP Autumn Meeting 2019

Session information

Symposium (Oral)

Symposium (technical) » New development of surface and interface evaluation methods for thin films

[19a-B31-1~5] New development of surface and interface evaluation methods for thin films

Thu. Sep 19, 2019 9:00 AM - 11:45 AM B31 (B31)

Yoshinobu Nakamura(Univ. of Tokyo), Tomoki Abe(Tottori Univ.)

△:Presentation by Applicant for JSAP Young Scientists Presentation Award
▲:English Presentation
▼:Both of Above
No Mark:None of Above

×

Authentication

Password authentication.
Password is required to view the PDF. Please enter a password to authenticate.

The password has been sent to pre-registrants.
For onsite registrants, please refer to the back of the name badge.
The password will be sent to all JSAP members in March 2020.

×

Please log in with your participant account.
» Participant Log In