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▲ [11a-S222-12] Twofold enhancement in reliability of organic light emitting diodes with thermally-induced morphological change of organic layer
キーワード：reliability, annealing, molecular orientation
The reliability enhancement because of annealing of organic light emitting diodes (OLEDs) fabricated under high vacuum condition (10-6~10-7 Torr) can be as a result of the morphological change of organic layers and/or the removal of residual water from the deposited material after annealing.1-2) Recently, we achieved the lower region of ultra-high vacuum (UHV) condition (10-10~10-11 Torr) with extremely low concentration of residual water by utilizing non-evaporable getter pumps (NEGPs) and regular turbo molecular pumps (TMPs) in OLED deposition chamber.3) In this report, we demonstrate twofold enhancement in reliability of OLED can be achieved by the thermally-induced morphological change of organic layers.