[12a-PB4-1~13] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

[12a-PB4-1] Analysis of Endurance in 40nm TaOx-based ReRAM

〇Kazuho Miyabe¹, Hiroshi Kinoshita¹, Tsubasa Yonai¹, Ken Takeuchi¹ (1.Chuo Univ.)

Keywords:ReRAM, Endurance