[23p-P04-1~5] 6.1 Ferroelectric thin films

[23p-P04-2] Structural Analysis of Mn-doped BiFeO₃ Thin Films under an Electric Field Measured by an X-ray Fluorescent Holography.

〇Ren Kato¹, Seiji Nakashima¹, Hironori Fujisawa¹, Koji Kimura², Naohisa Happo³, Artoni Kevin Roquero Ang⁴, Tastuya Kato², Yuta Yamamoto², Koichi Hayashi² (1.Univ. of Hyogo, 2.Nagoya Inst, Tech, 3.Hiroshima City Univ., 4.Toyota Inst. Tech)

Keywords:ferroelectric