4:30 PM - 4:45 PM
[26p-E105-12] Determination of Surface Position and Physical Property Analysis in Frequency Shift Curve by FM-AFM
Keywords:AFM, Force mapping
Oral presentation
6 Thin Films and Surfaces » 6.6 Probe Microscopy
Sat. Mar 26, 2022 1:30 PM - 4:45 PM E105 (E105)
Toru Utsunomiya(Kyoto Univ.), Mitsunori Kitta(AIST)
4:30 PM - 4:45 PM
Keywords:AFM, Force mapping