[1Cp01-07] Surface Analysis/Applied Surface Science/Evaluation Technique (ASS)

[1Cp01(2023技術賞)] Development of a novel soft X-ray second harmonic generation detection system and its application

*Toshihide Sumi¹, Masafumi Horio¹, Tomoaki Senoo¹, Tetsuya Wada¹, Yuki Tsujikawa¹, Xiaoni Zhang¹, Paul Manset², Mihoko Araki¹, Yasuyuki Hirata³, Walter S. Drisdell^4,5, John W. Freeland⁶, Angelique Amado^7,8, Michael Zuerch^7,8,9, Yuya Kubota¹⁰, Shigeki Owada^10,11, Kensuke Tono^10,11, Makina Yabashi^10,11, Craig P. Schwartz^4,12, Iwao Matsuda^1,13 (1. The Institute for Solid State Physics, The University of Tokyo, 2. Ecole Normale Superieure de Parise, 3. National Defense Academy of Japan, 4. Chemical Sciences Division, Lawrence Berkeley National Laboratory, 5. Joint Center for Artificial Photosynthesis, Lawrence Berkeley National Laboratory, 6. Advanced Photon Source, Argonne National Laboratory, 7. Department of Chemistry, University of California, Berkeley, 8. Materials Sciences Division, Lawrence Berkeley National Laboratory, 9. Fritz Haber Institute of the Max Planck Society, 10. RIKEN SPring-8 Center, 11. Japan Synchrotron Radiation Research Institute, 12. Nevada Extreme Conditions Laboratory, University of Nevada, 13. Trans-scale Quantum Science Institute, The University of Tokyo)

In this research, we succeeded in obtaining pristine soft X-ray SHG signals without external effects by adapting the ellipsometry method. Furthermore, by combining with a Wolter mirror, highly-sensitive SHG measurements were realized. This system is useful for detecting week SHG signals arising, for example, from buried interface as well as observing minor changes in intensity by external perturbation such as magnetic field. This innovative technique would pave a promising path for the advancement of materials science using non-linear X-ray spectroscopy.