Probe Microscopy Analysis of Defect-Driven Analog Memory Functions of TaO<sub>x</sub> for Neuromorphic Computing

Atsushi Tsurumaki-Fukuchi

Presentation information

Poster Session

D. Frontiers of Advanced Electronic Materials » [D-3] Defect Functionalized Energy and Electronic Materials

[D3-PV21] Slot 21

Mon. Dec 13, 2021 6:30 PM - 8:00 PM D3-PV21 (online)

6:30 PM - 8:00 PM

[D3-PV21-03] Probe Microscopy Analysis of Defect-Driven Analog Memory Functions of TaO_x for Neuromorphic Computing

*Atsushi Tsurumaki-Fukuchi¹, Takayoshi Katase², Hiromichi Ohta³, Masashi Arita¹, Yasuo Takahashi¹ (1. Faculty of IST, Hokkaido Univ. (Japan), 2. MSL, Tokyo Tech. (Japan), 3. RIES, Hokkaido Univ. (Japan))

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Presentation information

[D3-PV21] Slot 21

[D3-PV21-03] Probe Microscopy Analysis of Defect-Driven Analog Memory Functions of TaOx for Neuromorphic Computing

[D3-PV21-03] Probe Microscopy Analysis of Defect-Driven Analog Memory Functions of TaO_x for Neuromorphic Computing