[A3-P401] Poster 401

[A3-P401-09] Real-space Investigation of Exchange Bias Effect in FeMn/Co Bilayer Film by Photoemission Electron Microscopy (PEEM)

*Takuo Ohkochi^1,3, Akihiro Yoshida², Akira Yasui¹, Yu Maeda², Hiroaki Nishimoto², Keisuke Nogawa², Taku Konishi², Nobuyoshi hosoito² (1. Japan Synchrotron Radiation Research Inst. (Japan), 2. Nara Inst. Sci. Tech. (Japan), 3. RIKEN SPring-8 Center (Japan))

キーワード：exchange bias, photoemission electron microscopy, X-ray magnetic circular dichroism