[D2-O303] Oral 303

[D2-O303-02 (Symposium Invited)] Modeling of PLD-Based REBCO Coated Conductor Processing by The Combination of High Throughput Critical Current Measurements and Machine Learning

*Takanobu Kiss¹, Zeuy Wu¹, Kohei Higashikawa¹, Yuto Tanaka¹, Natthawirot Somjaijaroen¹, Roman Valikov², Valery Petrykin², Sergey Lee² (1. Kyushu Univ. (Japan), 2. Faraday Factory Japan LLC (Japan))

キーワード：REBCO, Coated Conductor, Critical Current, Machine Learning, High Throughput Measurements, Magnetic Microscopy