[D2-P204] Poster 204

[D2-P204-05] Analysis of Critical Current Density of H-doped SmFeAsO

*Tomoki Suemura¹, Ryusei Hotchi¹, Shunsuke Oka¹, Masanori Matoba^1,2, Yoichi Kamihara^1,2 (1. Keio Univ. (Japan), 2. Center for Spintronics Res. Network, Keio Univ. (Japan))

キーワード：Critical current density, SmFeAsO, Bean model