[TuE1] Filters and Signal Processing Devices

[TuE1-3] A Demultiplexer Immune from Fabrication-Error Impairments as an Enabler of Compact High-Channel-Count (> 64 ch) Dense WDM Systems on Low-End Si PIC Platforms

〇Tomoyuki Akiyama^1,2,3, Shoichiro Oda², Seok-Hwan Jeong^1,2,3, Yasuhiro Nakasha^1,2,3, Yu Tanaka^1,2,3, Takeshi Hoshida² (¹PETRA, Japan, ²Fujitsu Labs Ltd., Japan, ³Fujitsu Ltd., Japan)

キーワード：Photonic integrated circuits

We propose and theoretically validate a novel demultiplexer capable to automatically correct all fabrication-error-induced spectrum impairments. This technology, once realized, enables high-channel-count (> 64 ch) dense WDM systems on low-end Si PIC platforms.