OPTICS & PHOTONICS International Congress 2019

講演情報

XOPT2019

Oral Presentation

XFEL diagnostics

2019年4月24日(水) 10:30 〜 11:15 313+314 (Pacifico Yokohama Conference Center)

10:45 〜 11:00

[XOPT-4-02] Investigating FEL sources: a joint approach of Wavefront sensing, Metrology characterization, and WISEr simulations.

*Michele Manfredda1, Lorenzo Raimondi1, Marco Zangrando1, Nicola Mahne1 (1. Elettra - sincrotrone trieste s.c.p.a)