Correlation between Etch Pit Size and Threading Dislocation Propagation Habit in GaN Substrate Observed by Multiphoton-Excitation Photoluminescence

講演情報

LEDIA2020

Oral Presentation

2020年4月21日(火) 15:30 〜 17:00 411+412 (Conference Center)

Session Chair: Rie Togashi(Sophia University)

16:15 〜 16:30

*Mayuko Tsukakoshi¹, Tomoyuki Tanikawa¹, Masahiro Uemukai¹, Ryuji Katayama¹ (1. Osaka University)