[OPTMp-03] Discussion on measurement uncertainty used in laser interference measurement of annular end face of workpieces
This article discusses the allowable range changes and industrial applications caused by introducing measurement uncertainty based on the data obtained from 2528 pieces of wafer moving mechanism ejector pins inspected with laser interferometry technology.
要旨・抄録、PDFの閲覧には参加者用アカウントでのログインが必要です。参加者ログイン後に閲覧・ダウンロードできます。
» 参加者用ログイン