XOPT Poster Session

[XOPTp-05] Scanning X-ray Fluorescence Microscopy using white SR at SAGA Light Source

*Akio Yoneyama¹, Masahide Kawamoto¹, Satoshi Takaya² (1. SAGA Light Source, 2. National Institute of Advanced Industrial Science and Technology )

The X-ray energy of a scanning X-ray fluorescence microscope at SAGA Light Source was increased from 6 to 10 keV by introducing new mirrors with a designed incidence angle of 5 mrad to increase sensitivity to heavy elements.