[Tu-E] Poster Session

[Tu-E-17] Electronic Structure of YbNi₂X₂ (X=Si, Ge) Studied by Hard X-Ray Photoemission Spectroscopy

*Hitoshi Sato¹, Awabaikeli Rousuli¹, Yuji Matsumoto², Shigeo Ohara³, Takuya Ueda³, Toshiki Nagasaki¹, Kojiro Mimura⁴, Hiroaki Anzai⁴, Katsuya Ichiki⁴, Shigenori Ueda⁵, Kenya Shimada¹, Hirofumi Namatame¹ (1. Hiroshima University(Japan), 2. University of Toyama(Japan), 3. Nagoya Institute of Technology(Japan), 4. Osaka Prefecture University(Japan), 5. National Institute for Materials Science(Japan))

キーワード：valence fluctuation, Kondo lattice, hard x-ray photoemission spectroscopy