[Tu-E] Poster Session

[Tu-E-28] Relation of Ce 4f-5d Coulomb Repulsion to Quantum Critical Phenomena in Ce122 studied by Resonant Hard X-ray Photoemission Spectroscopy

*Gen Isumi¹, Masaichiro Mizumaki², Norimasa Sasabe², Akira Yasui², Yu Akedo¹, Taku Kawabata¹, Ryohei Shimokasa^1,2, Yoshinori Shibagaki¹, Naomi Kawamura², Eiji Ikenaga³, Satoshi Tsutsui², Hitoshi Sato⁴, Takayuki Uozumi¹, Tatsuma D Matsuda⁵, Yoshichika Ōnuki⁶, Kojiro Mimura¹ (1. Osaka Prefecture University(Japan), 2. Japan Synchrotron Radiation Research Institute(Japan), 3. Nagoya University(Japan), 4. Hiroshima University(Japan), 5. Tokyo Metropolitan University(Japan), 6. University of the Ryukyus(Japan))

Keywords:Quantum critical phenomena , Ce 4f-5d Coulomb repulsion, Electronic structure, Resonant hard x-ray photoemission spectroscopy, Single impurity Anderson model