A Deep Look into the Endurance Degradation in Silicon Ferroelectric FET

Kai Ni

doi:https://doi.org/10.7567/SSDM.2023.K-1-01

講演情報

Oral Presentation

02: Advanced and Emerging Memories / New Applications

[K-1] Ferroelectric Devices

2023年9月6日(水) 14:00 〜 15:30 Room K (234, Bldg. 2)

Session Chairs: Halid Mulaosmanovic (GlobalFoundries., Germany), E Ray Hsieh (National Central Univ.)

14:00 〜 14:30

[K-1-01 (Invited)] A Deep Look into the Endurance Degradation in Silicon Ferroelectric FET

^○Kai Ni¹ (1. Univ. of Notre Dame (United States of America))

https://doi.org/10.7567/SSDM.2023.K-1-01

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講演情報

[K-1] Ferroelectric Devices

[K-1-01 (Invited)] A Deep Look into the Endurance Degradation in Silicon Ferroelectric FET

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