Comparative Study of Variability in FeFET Memories with Different Erase Voltages

JAY LIU

doi:https://doi.org/10.7567/SSDM.2023.PS-2-07

[PS-2-07] Comparative Study of Variability in FeFET Memories with Different Erase Voltages

^○JAY LIU¹, Cheng-Hung Wu¹, Masaharu Kobayashi², Chun-Jung Su³, Vita Pi-Ho Hu¹ (1. National Taiwan Univ. (Taiwan), 2. Univ. of Tokyo (Japan), 3. National Yang Ming Chiao Tung Univ. (Taiwan))

https://doi.org/10.7567/SSDM.2023.PS-2-07

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講演情報

[PS-2] 02: Advanced and Emerging Memories / New Applications

[PS-2-07] Comparative Study of Variability in FeFET Memories with Different Erase Voltages

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