[T21] Other Functional Materials

[15P-T21-07] Strain Analysis of Thermoelectric Materials Using High-resolution Synchrotron X-ray Diffraction Data

H. Nakasawa¹, T. Shobu², A. Tominaga², *M. Fujii¹, H. Mstsumoto¹, M. Matsuda¹, T. Shimada¹, V. Trivedi³, M. Tachibana³, N. Tsujii³, T. Mori³ (1.Proterial, Ltd. Global Research and Innovative Technology Center, Japan, 2.Materials Science Research Center, Japan Atomic Energy Agency, Japan, 3.Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, Japan)

キーワード：Co–Sb based skutterudite, Sb-flux method, compressive strength limit, in situ strain measurement method

A compressive strength limit is one of critical parameters for thermoelectric materials. In this study, we synthesized a single crystal of Yb-filled Co–Sb based skutterudite. We assessed the compressive pressure dependence of internal strain using high-resolution synchrotron radiation X-rays at SPring-8. The prepared single crystal was identified as Yb0.148Co4Sb12.54, with a lattice parameter of 9.0504 Å. Compressive testing was performed until the sample fractured, revealing a compressive strength limit of 591.3 MPa. The stress–strain curve exhibited a nearly constant slope for strains exceeding 0.07%, leading to an estimated Young’s modulus of 154.6 GPa.