Emission Zone Measurement Gives Insight into the Suitability of Accelerated Aging Extrapolation

Rossa Mac Ciarnain

doi:https://doi.org/10.36463/idw.2020.0415

15:40 〜 15:55

[OLED5-4L] Emission Zone Measurement Gives Insight into the Suitability of Accelerated Aging Extrapolation

*Rossa Mac Ciarnain¹, Hin Wai Mo^3,4, Kaori Nagayoshi³, Hiroshi Fujimoto^3,4, Kentaro Harada^3,4, Tung Huei Ke², Paul Heremans^1,2, Chihaya Adachi^3,4 (1. KU Leuven(Belgium), 2. IMEC(Belgium), 3. i3 OPERA(Japan), 4. OPERA(Japan))

OLED, emission zone, accelerated ageing, degradation, ageing

https://doi.org/10.36463/idw.2020.0415

Accelerated OLED ageing at higher current densities is commonly used to extrapolate lower current density device lifetime benchmarks. Different emission zones and device ageing were measured at different current densities giving more insight into the suitability of such accelerated ageing assumptions.

Proceedings of the International Display Workshops Volume 27 (IDW '20)

[OLED5-4L] Emission Zone Measurement Gives Insight into the Suitability of Accelerated Aging Extrapolation