International Display Workshops General Incorporated Association

11:10 AM - 11:30 AM

[DXR1-2 (Invited)] Study of BGaN Semiconductor for Novel Neutron Semiconducting Detector

*Takayuki Nakano1, Toru Aoki1 (1. Shizuoka University (Japan))

BGaN, neutron detection, semiconductor detector, compound semiconductor

https://doi.org/10.36463/idw.2023.1424

BGaN semiconductor is expected as a novel neutron detection technology because of including B atom, which has large neutron capture cross section. Furthermore, BGaN has high-temperature tolerance and is expected as a radiation detector in a high-temperature conditions. In this study, the temperature tolerance of BGaN semiconductor detectors was investigated.